Translator Disclaimer
18 February 1981 Post Focal Plane Processing For Staring IR Imagers
Author Affiliations +
Abstract
Staring infrared imagers presently under development possess an inherent fixed pattern noise characteristic at the output which is Primarily determined by the non-uniformities in detector resoonsivity, CCD threshold variations and detector/CCD electrical coupling circuitry. This fixed pattern noise can take up as much as 50% of the focal plane dynamic range and, as such, generally requires high accuracy, high speed compensation electronics which then allows the full NEAT sensitivity oerformance of the focal plane to be realized. This paper describes the requirements for the comoensation electronics and discusses different implementation circuitry for both conventional "shuttered" calibration (i.e., reimaging of a uniform thermal reference source to calibrate the non-uniformity coefficients) and for a concept which has been developed called the "shutterless" compensation which uses scene dynamics and statistics to calculate the correction coefficient values.
© (1981) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Fitch, N. A. Foss, and P. Narendra "Post Focal Plane Processing For Staring IR Imagers", Proc. SPIE 0244, Mosaic Focal Plane Methodologies I, (18 February 1981); https://doi.org/10.1117/12.959323
PROCEEDINGS
8 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Design and performance of the ImagIR a commercial infrared...
Proceedings of SPIE (September 15 1992)
VIS: the visible imager for Euclid
Proceedings of SPIE (September 20 2012)
Design of the IMACS 8Kx8K dewar and detector system
Proceedings of SPIE (March 06 2003)
The Cambridge Charge-Coupled Device (CCD) System
Proceedings of SPIE (December 31 1980)

Back to Top