3 November 1980 Status Of Cryogenic Refractive-Index Measurements
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This review paper summarizes and identifies the sources of cryogenic refractive index measurements in the infrared. Representative refractive index versus temperature and wave-length data are presented for the following materials: germanium, silicon, hot-pressed cadmium telluride (Irtran 6), hot-pressed zinc sulfide (Irtran 2), polycrystalline cadmium telluride, cesium iodide, cesium bromide, zinc selenide, and birefringent thallium arsenic selenide. The measurement techniques and the errors associated with the measurements are discussed, and the need for additional measurements is delineated.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William L. Wolfe, William L. Wolfe, Arthur G. DeBell, Arthur G. DeBell, James M. Palmer, James M. Palmer, } "Status Of Cryogenic Refractive-Index Measurements", Proc. SPIE 0245, Cryogenically Cooled Sensor Technology, (3 November 1980); doi: 10.1117/12.959348; https://doi.org/10.1117/12.959348

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