3 December 1980 Routine Testing of Diamond-Turned Optics Using A 10.6 Micron Interferometer
Author Affiliations +
Abstract
A variety of difficulties have been encountered while testing diamond turned optics with a standard HeNe interferometer. This is especially true in multiple-pass test configurations, where scattering and moire' effects create an ambiguity in interpretation of the interferogram, making slope error and finish determina-tion difficult if not impossible. In a production environment it is also desirable to speed inspection and "buy-off" by viewing the surface at the wavelength of use, namely in the 8-12 micron region. A 10.6 micron laser unequal path interferometer was designed and built to satisfy these needs. Zinc selenide optics are used throughout to facilitate alignment in the visible and allow expansion to near infrared wavelengths in the future. The output is displayed on a TV monitor through the use of a pyroelectric vidicon(PEV). Examples are given of standard interferometric tests in the IR as compared to visible interferograms, clearly showing the reduced effects of surface errors.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David C. Smith, "Routine Testing of Diamond-Turned Optics Using A 10.6 Micron Interferometer", Proc. SPIE 0246, Contemporary Infrared Sensors and Instruments, (3 December 1980); doi: 10.1117/12.959361; https://doi.org/10.1117/12.959361
PROCEEDINGS
6 PAGES


SHARE
RELATED CONTENT

3.8 Micron Interferometry For Testing Coated Optics
Proceedings of SPIE (April 29 1982)
Novel interferometer
Proceedings of SPIE (January 22 2004)
Design review of an infrared phase-shifting interferometer
Proceedings of SPIE (September 02 1992)

Back to Top