25 November 1980 Millimeter Wave Fabry-Perot Interferometer For The Measurement Of The Conductivity Of Thin Films For Solar Cells
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Abstract
The conductivity of a thin film on a metal plate can be calculated from measurements of the Q of the cavity of a Fabry-Perot interferometer and the thin film if the cavity without the film has been previously measured. The theory for the conductivity which shows a cubic dependence on the thickness of the film has been developed. The measurement system at 93 gigahertz is described. Experimental results are presented.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Donald S. Gage, Donald S. Gage, Leonard Lewin, Leonard Lewin, Frank S. Barnes, Frank S. Barnes, } "Millimeter Wave Fabry-Perot Interferometer For The Measurement Of The Conductivity Of Thin Films For Solar Cells", Proc. SPIE 0248, Role of Electro-Optics in Photovoltaic Energy Conversion, (25 November 1980); doi: 10.1117/12.970600; https://doi.org/10.1117/12.970600
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