Solar Cell Characterization at Rockwell International

Marshall J. Cohen; J. A. Cape; M. D. Paul; D. L. Miller; J. S. Harris Jr.

doi:10.1117/12.970593

25 November 1980 Solar Cell Characterization at Rockwell International

Marshall J. Cohen, J. A. Cape, M. D. Paul, D. L. Miller, J. S. Harris Jr.

Proceedings Volume 0248, Role of Electro-Optics in Photovoltaic Energy Conversion; (1980) https://doi.org/10.1117/12.970593
Event: 24th Annual Technical Symposium, 1980, San Diego, United States

Abstract

The Solar Cell Test Facilities at Rockwell International are described. The facilities enable the characterization of cells in the dark and under a variety of illumination conditions. A basic automated measurements system has been built around an Analog Devices MACSYM II minicomputer. Computerized dark I-V and C-V tests allow automatic determination of barrier height, diffusion potentials, doping profiles, diode n-factors, and extrapolated reverse saturation currents. The same system is used to measure the illuminated I-V characteristics and determine I_SC, V_OC , F.F., and locate the maximum power point. The facility also contains a computerize spectrophotometer which performs simultaneous measurements of either absolute spectral response and reflectivity or transmissivity and reflectivity. Concentrator solar cells can be characterized at up to 200X insolation using a chopped, concentrated Schoeffel solar simulator. A unique, high concentration test facility utilizing sunlight has also been built.

Citation Download Citation

Marshall J. Cohen, J. A. Cape, M. D. Paul, D. L. Miller, and J. S. Harris Jr. "Solar Cell Characterization at Rockwell International", Proc. SPIE 0248, Role of Electro-Optics in Photovoltaic Energy Conversion, (25 November 1980); https://doi.org/10.1117/12.970593

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