17 December 1980 Image Processing Hardware And Software For The 90-Element Pushbroom Infrared/Charge-Coupled Device/Multiplexer (IR/CCD/MUX) Field Test Instrument
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Abstract
Presented here is a review of an inhouse image processing facility, which has been improved for NASA/GSFC, to reduce raw 8-bit data tapes from the 90-element pushbroom IR/CCD/MUX field test instrument to 90 x 512 pixel frames of thermal infrared (8-14 micrometers) hard copy imagery. The 512 pixel length (160° panoramic scan) frames are recorded in 16 seconds (maximum rate) on magnetic tape. These tapes are then taken to the image processing laboratory where second order temperature calibration and image enhancement techniques are used to generate "quick look" 8 x 8 dot matrix line printer hard copy images or CRT displays in under 30 minutes. Final enhanced image data tapes are then recorded on photographic film using a digital film writer which quantatize the data into 256 grey levels. High quality, 16" x 20" photographic enlargements of selected imagery are made from these negatives using standard photographic techniques. The first hard copy imagery was obtained July 15, 1980. Several 90 x 256 pixel frames were recorded and image processed. Hard copy is from the 8 x 8 dot matrix printer. Initially, only warm objects were recognizable in the unprocessed data; however, once the temperature range of the imagery was adjusted and calibrated against three blackbody temperature frames, considerable detail was resolved in human forms and facial features. We are currently optimizing the integration time, chopper/signal electronics phasing, and CCD bias and the application of the image processing programs described herein.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thomas J. Brown "Image Processing Hardware And Software For The 90-Element Pushbroom Infrared/Charge-Coupled Device/Multiplexer (IR/CCD/MUX) Field Test Instrument", Proc. SPIE 0253, Modern Utilization of Infrared Technology VI, (17 December 1980); doi: 10.1117/12.959502; https://doi.org/10.1117/12.959502
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