Paper
19 November 1980 Instrumentation For Measuring The Refractive Index Structure Constant
Carl D Vought
Author Affiliations +
Proceedings Volume 0255, Practical Electro-Optical Instruments and Techniques; (1980) https://doi.org/10.1117/12.959555
Event: 1980 Huntsville Technical Symposium, 1980, Huntsville, United States
Abstract
One of the measurable parameters of interest to experimenters who evaluate resolution characteristics of optical systems is the refractive index structure constant, C. During the last five years, several research programs have addressed the subject of measuring average values of Cn over paths of various lengths rather than performing point measurements with differential thermometers to determine C. These research programs have resulted in workable designs of instruments, but little has been done to evolve these designs into reliable and available commercial products. This paper relates the experiences involved in converting a well developed laboratory instrument into a configuration for use in the field.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Carl D Vought "Instrumentation For Measuring The Refractive Index Structure Constant", Proc. SPIE 0255, Practical Electro-Optical Instruments and Techniques, (19 November 1980); https://doi.org/10.1117/12.959555
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Receivers

Light sources

Calibration

Refraction

Refractive index

Turbulence

Atmospheric optics

Back to Top