Paper
23 December 1980 Applications Of Infrared Thermography In The Analysis Of Induced Surface Currents Due To Incident Electromagnetic (EM) Radiation On Complex Shapes
V. M. Martin, R. M. Sega, C. V. Stewart, R. W. Burton
Author Affiliations +
Proceedings Volume 0256, Infrared Systems; (1980) https://doi.org/10.1117/12.959580
Event: 1980 Huntsville Technical Symposium, 1980, Huntsville, United States
Abstract
Thermography has been available for some time as an aid in the determination of temperature differentials. Burton, et al, have demonstrated that thermographic techniques may be used qualitatively to detect induced surface currents resulting from impinging Electromagnetic (EM) waves on particular shapes. The surface currents are detectable because of the energy deposited on the object in the form of I2R heating. A knowledge of the induced surface currents is invaluable to the study of radar cross section reduction and Electromagnetic Pulse (EMP) absorption. Therefore, a method is presented which provides a method of determining the temperature distribution on a complex shape subjected to microwave radiation. Thermographic detectors are either energy detectors (thermocouples) or photon detectors (semiconductors). A model is developed for each type which describes the infrared emission detection associated with a complex shape.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. M. Martin, R. M. Sega, C. V. Stewart, and R. W. Burton "Applications Of Infrared Thermography In The Analysis Of Induced Surface Currents Due To Incident Electromagnetic (EM) Radiation On Complex Shapes", Proc. SPIE 0256, Infrared Systems, (23 December 1980); https://doi.org/10.1117/12.959580
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KEYWORDS
Infrared radiation

Electromagnetism

Thermography

Cameras

Shape analysis

Infrared imaging

Sensors

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