Response Irregularities In Extrinsic Silicon Detectors

Gene R. Ezell

doi:10.1117/12.959591

23 December 1980 Response Irregularities In Extrinsic Silicon Detectors

Gene R. Ezell

Proceedings Volume 0256, Infrared Systems; (1980) https://doi.org/10.1117/12.959591
Event: 1980 Huntsville Technical Symposium, 1980, Huntsville, United States

Abstract

Extrinsic LWIR detectors exhibit departures from a "normal" linear response (irregularities). In the early 1970's, observations of these phenomena were inconsistent and unrepeatable, and the phenomena were not explainable by existing physical theory, so many observers labeled the phenomena "anomalous." Recent investigations into detector theory, processing, and application have shown repeatability and revealed apparent connections between various irregular aspects of detector response, and have indicated means of mitigating the irregularities' effects. Herein, extrinsic silicon detector irregularities generally recognized by the LWIR detector community are described with illustrations drawn from the literature. Pertinent discussions from the recent Extrinsic Detector Behavior Conference are summarized. The Army/Air Force program for mitigating the irregularity problem is outlined.

Citation Download Citation

Gene R. Ezell "Response Irregularities In Extrinsic Silicon Detectors", Proc. SPIE 0256, Infrared Systems, (23 December 1980); https://doi.org/10.1117/12.959591

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