3 March 1981 Formulas For Estimating Stray-Radiation Levels In Well-Baffled Optical Systems
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Proceedings Volume 0257, Radiation Scattering in Optical Systems; (1981); doi: 10.1117/12.959600
Event: 1980 Huntsville Technical Symposium, 1980, Huntsville, United States
Abstract
The determination of the stray radiation in a well-baffled optical system reduces to the calculation of the scattered energy propagated along a few distinct paths. Approximate formulas are derived that estimate the amount of unwanted energy reaching a focal plane detector from these paths. In order to simplify the calculations, single edge scatter, double internal scatter, and diffraction from any vane structure on the main baffle tube of the system is treated as a macroscopic process with a single effective BRDF. The predic-tions made by the formulas for a typical system compare favorably with more extensive calculations made by the APART stray radiation analysis computer program.
© (1981) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alan W Greynolds, "Formulas For Estimating Stray-Radiation Levels In Well-Baffled Optical Systems", Proc. SPIE 0257, Radiation Scattering in Optical Systems, (3 March 1981); doi: 10.1117/12.959600; https://doi.org/10.1117/12.959600
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KEYWORDS
Scattering

Reflectivity

Diffraction

Mirrors

Sensors

Bidirectional reflectance transmission function

Laser scattering

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