3 April 1981 Solid-State Aspect Sensor
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Proceedings Volume 0265, Shuttle Pointing of Electro-Optical Experiments; (1981) https://doi.org/10.1117/12.959869
Event: 1981 Los Angeles Technical Symposium, 1980, Los Angeles, United States
Programs in development for the near future will require pointing sensors with accuracies in the region of 1 arc-sec and sub-arc-sec stability. The Advanced X-Ray Astronomical Facility, Annular Suspension Pointing System, Shuttle Infra-Red Telescope Facility and Stereosat are representatives of these programs. This paper describes a Solid State Aspect Sensor which could support this pointing capability and the testing technology necessary to verify its performance. The sensor uses a Charge Coupled Device (CCD) array integrated with a high-performance optical assembly. Perkin-Elmer has developed in-house a solid state sensor which could be used for precision pointing and attitude estimation applications. A test facility has been established which can be used to evaluate CCD arrays and optical assemblies for their suitability and use in a star sensor. The detail design of a stellar sensor to meet 1 arc-sec pointing requirements is presented. Optical performance characteristics are discussed, as is the verification testing of a prototype optical assembly. Test data are provided. The optical assembly is a 253-mm focal length, F/1.5 catadioptric lens system. Discussion of the solid state focal plane includes focal plane requirements and centroiding algorithms, focal plane and CCD test facilities, representative test data from linear CCD arrays, and a candidate CCD array for this application. An integrated sensor test station is described. Important considerations in the development of this precision pointing sensor are also presented, along with the predicted sensor performance based upon computer simulations.
© (1981) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. Cassidy, L. Cassidy, L. Kaplan, L. Kaplan, } "Solid-State Aspect Sensor", Proc. SPIE 0265, Shuttle Pointing of Electro-Optical Experiments, (3 April 1981); doi: 10.1117/12.959869; https://doi.org/10.1117/12.959869

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