15 September 1981 Design Approach To A High-Precision Reflectometer For Component Study Evaluation
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Proceedings Volume 0270, High Power Lasers and Applications; (1981) https://doi.org/10.1117/12.931754
Event: 1981 Los Angeles Technical Symposium, 1980, Los Angeles, United States
Abstract
High-power lasers require beam directing optics with high damage thresholds. To achieve this, coatings with very high reflectivity and low absorption are being developed by many investigators. This paper describes a reflectometer for measuring these high reflectances to a very high precision. Parameters investigated for this design are source stability, detector limitations, data collection schemes, and the basic optical configuration. The most promising optical configurations investigated include a single-bounce system and a goniometric type double-bounce system. Data collection was best accomplished using a noise-eliminating sample and hold system in conjunction with a gain compensated, AC coupled amplifier referenced to a duplicate system sampling the source output. Conventional lock-in and differential amplifiers were not found acceptable for the high precision sought.
© (1981) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cem Gokay, Cem Gokay, Kevin Harding, Kevin Harding, John Loomis, John Loomis, Joe Marcheski, Joe Marcheski, } "Design Approach To A High-Precision Reflectometer For Component Study Evaluation", Proc. SPIE 0270, High Power Lasers and Applications, (15 September 1981); doi: 10.1117/12.931754; https://doi.org/10.1117/12.931754
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