15 September 1981 Design Approach To A High-Precision Reflectometer For Component Study Evaluation
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Proceedings Volume 0270, High Power Lasers and Applications; (1981) https://doi.org/10.1117/12.931754
Event: 1981 Los Angeles Technical Symposium, 1980, Los Angeles, United States
Abstract
High-power lasers require beam directing optics with high damage thresholds. To achieve this, coatings with very high reflectivity and low absorption are being developed by many investigators. This paper describes a reflectometer for measuring these high reflectances to a very high precision. Parameters investigated for this design are source stability, detector limitations, data collection schemes, and the basic optical configuration. The most promising optical configurations investigated include a single-bounce system and a goniometric type double-bounce system. Data collection was best accomplished using a noise-eliminating sample and hold system in conjunction with a gain compensated, AC coupled amplifier referenced to a duplicate system sampling the source output. Conventional lock-in and differential amplifiers were not found acceptable for the high precision sought.
© (1981) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cem Gokay, Cem Gokay, Kevin Harding, Kevin Harding, John Loomis, John Loomis, Joe Marcheski, Joe Marcheski, "Design Approach To A High-Precision Reflectometer For Component Study Evaluation", Proc. SPIE 0270, High Power Lasers and Applications, (15 September 1981); doi: 10.1117/12.931754; https://doi.org/10.1117/12.931754
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