Low-Level Losses In Ultraviolet Laser Window Materials

David F. Edwards; Ellen Ochoa; Philip Baumeister

doi:10.1117/12.932017

30 December 1981 Low-Level Losses In Ultraviolet Laser Window Materials

David F. Edwards, Ellen Ochoa, Philip Baumeister

Proceedings Volume 0288, Los Alamos Conf on Optics '81; (1981) https://doi.org/10.1117/12.932017
Event: Los Alamos Conference on Optics, 1981, Los Alamos, United States

Abstract

The low-level insertion losses have been measured for uv grade CaF2 and MgF2 using the multipass reflectometer. These losses include surface absorption and surface losses as well as bulk absorption. Comparing our data with absorption measured by calorimetric methods indicates that insertion losses are dominated by surface effects and bulk properties play only a minor role.

Citation Download Citation

David F. Edwards, Ellen Ochoa, and Philip Baumeister "Low-Level Losses In Ultraviolet Laser Window Materials", Proc. SPIE 0288, Los Alamos Conf on Optics '81, (30 December 1981); https://doi.org/10.1117/12.932017

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