29 October 1981 Beam Condenser-Microscope System For High Pressure Studies And General Microsampling
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Proceedings Volume 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy; (1981) https://doi.org/10.1117/12.932124
Event: 1981 International Conference on Fourier Transform Infrared Spectroscopy, 1981, Columbia, United States
Abstract
The development of a new, versatile beam condenser system for FT-IR spectrometers will be described. Primarily designed for use with the diamond-anvil high pressure cell, it also serves as a very convenient accessory for general microsampling. A major advantage of the system is the routine capability to visually observe the sample, using conventional optical microscopy, while the sample remains in place in the spectrometer. This adds a powerful tool to spectral studies of phase transitions, decompositions, kinetics, and distributions in microscopically heterogeneous samples. Applications of the system in high pressure studies of model lubricants will be discussed.
© (1981) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. W. Brasch, J. W. Brasch, C. J. Riggle, C. J. Riggle, } "Beam Condenser-Microscope System For High Pressure Studies And General Microsampling", Proc. SPIE 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy, (29 October 1981); doi: 10.1117/12.932124; https://doi.org/10.1117/12.932124
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