Angle Measurements Of Scanners By Interferometry

Jacques E. Ludman; Cardinal Warde

doi:10.1117/12.932560

26 April 1982 Angle Measurements Of Scanners By Interferometry

Jacques E. Ludman, Cardinal Warde

Proceedings Volume 0299, Advances in Laser Scanning Technology; (1982) https://doi.org/10.1117/12.932560
Event: 25th Annual Technical Symposium, 1981, San Diego, United States

Abstract

A novel interferometer is described which is capable of measuring the parallelism of two faces of the same object. The use of this interferometer to compare an angle of a scanner with the angle of a reference standard is described and the results of measurements of a state-of-the-art optical scanner are given.

Citation Download Citation

Jacques E. Ludman and Cardinal Warde "Angle Measurements Of Scanners By Interferometry", Proc. SPIE 0299, Advances in Laser Scanning Technology, (26 April 1982); https://doi.org/10.1117/12.932560

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