26 April 1982 Angle Measurements Of Scanners By Interferometry
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Abstract
A novel interferometer is described which is capable of measuring the parallelism of two faces of the same object. The use of this interferometer to compare an angle of a scanner with the angle of a reference standard is described and the results of measurements of a state-of-the-art optical scanner are given.
© (1982) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jacques E. Ludman, Jacques E. Ludman, Cardinal Warde, Cardinal Warde, } "Angle Measurements Of Scanners By Interferometry", Proc. SPIE 0299, Advances in Laser Scanning Technology, (26 April 1982); doi: 10.1117/12.932560; https://doi.org/10.1117/12.932560
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