26 April 1982 Angle Measurements Of Scanners By Interferometry
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Abstract
A novel interferometer is described which is capable of measuring the parallelism of two faces of the same object. The use of this interferometer to compare an angle of a scanner with the angle of a reference standard is described and the results of measurements of a state-of-the-art optical scanner are given.
© (1982) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jacques E. Ludman, Cardinal Warde, "Angle Measurements Of Scanners By Interferometry", Proc. SPIE 0299, Advances in Laser Scanning Technology, (26 April 1982); doi: 10.1117/12.932560; https://doi.org/10.1117/12.932560
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