26 April 1982 Axial-Mode Piezoelectrically-Driven Beam Deflectors
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A random-access beam scanner using axial-mode expansion of a stack of piezoelectric disks has been fabricated and tested. The measured performance was comparable to that of scanners using galvanometer or piezoelectric bimorph drivers. Computations predict that improved coupling of the stress developed by axial-mode devices can extend the performance of these devices to levels well beyond those now available.
© (1982) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. S. Randall, D. S. Randall, C. G. O'Neill, C. G. O'Neill, "Axial-Mode Piezoelectrically-Driven Beam Deflectors", Proc. SPIE 0299, Advances in Laser Scanning Technology, (26 April 1982); doi: 10.1117/12.932545; https://doi.org/10.1117/12.932545

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