3 May 1982 Optical Constants In The Extreme Ultraviolet And Soft X-Ray Region
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Proceedings Volume 0315, Reflecting Optics for Synchrotron Radiation; (1982) https://doi.org/10.1117/12.932995
Event: 1981 Brookhaven Conferences, 1981, Upton, United States
The nature of optical constants and their measurement by reflection or absorption techniques in the extreme ultraviolet and soft x-ray spectral region from 30 to 3000eV is discussed with emphasis on mirror design. Sources of optical constant data are mentioned and reflectance measurements for SiC and Kanigen between 40 and 200 eV are reported.
© (1982) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. C. Rife, J. C. Rife, J. F. Osantowski, J. F. Osantowski, } "Optical Constants In The Extreme Ultraviolet And Soft X-Ray Region", Proc. SPIE 0315, Reflecting Optics for Synchrotron Radiation, (3 May 1982); doi: 10.1117/12.932995; https://doi.org/10.1117/12.932995


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