24 March 1982 High Resolution X-Ray Scattering Measurements
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Proceedings Volume 0316, High Resolution Soft X-Ray Optics; (1982) https://doi.org/10.1117/12.933152
Event: 1981 Brookhaven Conferences, 1981, Upton, United States
Abstract
The results of high angular resolution grazing incidence scattering measurements of highly polished, coated optical flats in the X-ray spectral range of 1.5 to 6.4 κeV are reported. The interpretation of these results in terms of surface microtopography is presented and the implications for grazing incidence X-ray imaging are discussed.
© (1982) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Martin V. Zombeck, Heinrich Brauninger, Axel Ondrusch, Peter Predehl, "High Resolution X-Ray Scattering Measurements", Proc. SPIE 0316, High Resolution Soft X-Ray Optics, (24 March 1982); doi: 10.1117/12.933152; https://doi.org/10.1117/12.933152
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