24 March 1982 High Resolution X-Ray Scattering Measurements
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Proceedings Volume 0316, High Resolution Soft X-Ray Optics; (1982) https://doi.org/10.1117/12.933152
Event: 1981 Brookhaven Conferences, 1981, Upton, United States
The results of high angular resolution grazing incidence scattering measurements of highly polished, coated optical flats in the X-ray spectral range of 1.5 to 6.4 κeV are reported. The interpretation of these results in terms of surface microtopography is presented and the implications for grazing incidence X-ray imaging are discussed.
© (1982) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Martin V. Zombeck, Martin V. Zombeck, Heinrich Brauninger, Heinrich Brauninger, Axel Ondrusch, Axel Ondrusch, Peter Predehl, Peter Predehl, } "High Resolution X-Ray Scattering Measurements", Proc. SPIE 0316, High Resolution Soft X-Ray Optics, (24 March 1982); doi: 10.1117/12.933152; https://doi.org/10.1117/12.933152

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