Single Event Testing For Very Large Scale Integrated (VLSI) Circuits In Space Applications

Charles S. Guenzer

doi:10.1117/12.933162

4 August 1982 Single Event Testing For Very Large Scale Integrated (VLSI) Circuits In Space Applications

Charles S. Guenzer

Proceedings Volume 0319, Very High Speed Integrated Circuit Technology for Electro-Optic Applications; (1982) https://doi.org/10.1117/12.933162
Event: 1982 Los Angeles Technical Symposium, 1982, Los Angeles, United States

Abstract

Advanced integrated circuits when exposed to a space environment are prone to single event radiation effects. Accelerators can provide particle beams which test electrical components in a simulation of the space environments. Methods are available in most cases to relate the accelerator results to predicted performance in space.

Citation Download Citation

Charles S. Guenzer "Single Event Testing For Very Large Scale Integrated (VLSI) Circuits In Space Applications", Proc. SPIE 0319, Very High Speed Integrated Circuit Technology for Electro-Optic Applications, (4 August 1982); https://doi.org/10.1117/12.933162

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