4 August 1982 Single Event Testing For Very Large Scale Integrated (VLSI) Circuits In Space Applications
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Abstract
Advanced integrated circuits when exposed to a space environment are prone to single event radiation effects. Accelerators can provide particle beams which test electrical components in a simulation of the space environments. Methods are available in most cases to relate the accelerator results to predicted performance in space.
© (1982) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Charles S. Guenzer, Charles S. Guenzer, } "Single Event Testing For Very Large Scale Integrated (VLSI) Circuits In Space Applications", Proc. SPIE 0319, Very High Speed Integrated Circuit Technology for Electro-Optic Applications, (4 August 1982); doi: 10.1117/12.933162; https://doi.org/10.1117/12.933162
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