4 August 1982 Technology Assurance For Very Large Scale Integrated (VLSI)/VHSIC Custom Devices
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Abstract
Criteria and procedures that provide assurance as to a manufacturer's ability to provide functionally reproducible and reliable devices are desirable prior to user commitment to the design of a custom device. Additions and modifications to current practices are necessary when procurement of small batches of high-density, custom microelectronic devices are anticipated. This paper analyzes the problems that may be encountered with emerging VLSI/VHSIC technologies and describes a method that, if implemented, could minimize costs and adverse schedule impact to the user.
© (1982) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Arnold J. Borofsky, Arnold J. Borofsky, } "Technology Assurance For Very Large Scale Integrated (VLSI)/VHSIC Custom Devices", Proc. SPIE 0319, Very High Speed Integrated Circuit Technology for Electro-Optic Applications, (4 August 1982); doi: 10.1117/12.933163; https://doi.org/10.1117/12.933163
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