29 April 1982 3.8 Micron Interferometry For Testing Coated Optics
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Proceedings Volume 0325, Optical Thin Films; (1982) https://doi.org/10.1117/12.933297
Event: 1982 Los Angeles Technical Symposium, 1982, Los Angeles, United States
Abstract
Large wavefront phase errors introduced by small thickness changes in multilayer high reflectance coatings are discussed. The importance of measuring these wavefront phase errors at the wavelength the coating is to be used is illustrated. Plans for an interferometer working at a wavelength of 3.8 microns for measuring wavefront phase errors introduced by coating nonuniformity are described.
© (1982) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James C. Wyant, James C. Wyant, "3.8 Micron Interferometry For Testing Coated Optics", Proc. SPIE 0325, Optical Thin Films, (29 April 1982); doi: 10.1117/12.933297; https://doi.org/10.1117/12.933297
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