Measurement Of Infrared Multilayer Filters At Temperatures Down To 4 Deg K

J. S. Seeley; R. Hunneman; A. Whatley; D. L. Stierwalt

doi:10.1117/12.933303

29 April 1982 Measurement Of Infrared Multilayer Filters At Temperatures Down To 4 Deg K

J. S. Seeley, R. Hunneman, A. Whatley, D. L. Stierwalt

Proceedings Volume 0325, Optical Thin Films; (1982) https://doi.org/10.1117/12.933303
Event: 1982 Los Angeles Technical Symposium, 1982, Los Angeles, United States

Abstract

Measurement is reported at 4 deg K (and blocked transmittance below 10-5) of PbTe/ZnS thin-film filters deposited on Ge substrates. The reduced carrier-absorption which is obtained by cooling these PbTe films is found to accord with simple theory. Advantage for various high-performance multilayers by cooling is significant at the longer wavelengths, and has been verified.

Citation Download Citation

J. S. Seeley, R. Hunneman, A. Whatley, and D. L. Stierwalt "Measurement Of Infrared Multilayer Filters At Temperatures Down To 4 Deg K", Proc. SPIE 0325, Optical Thin Films, (29 April 1982); https://doi.org/10.1117/12.933303

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