29 April 1982 Spectral Emittance Measurements Of Thin Films
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Proceedings Volume 0325, Optical Thin Films; (1982) https://doi.org/10.1117/12.933300
Event: 1982 Los Angeles Technical Symposium, 1982, Los Angeles, United States
Abstract
Infrared spectral emittance measurements can be used to determine the optical characteristics of thin films. The method is discussed and some examples are presented.
© (1982) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Donald L. Stierwalt, "Spectral Emittance Measurements Of Thin Films", Proc. SPIE 0325, Optical Thin Films, (29 April 1982); doi: 10.1117/12.933300; https://doi.org/10.1117/12.933300
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