30 June 1982 Effect Of Optical Aberrations On Scanning Michelson Interferometers
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Proceedings Volume 0327, Sensor Design Using Computer Tools; (1982) https://doi.org/10.1117/12.933356
Event: 1982 Los Angeles Technical Symposium, 1982, Los Angeles, United States
Abstract
It is often advantageous, when faced with the necessity of characterizing or recognizing a distant source, to measure the spectral distribution. This is normally done with a scanning Michelson interferometer fed by a large collecting telescope. The effect of errors in the Michelson interferometer has been analyzed by several sources,1,2 but little work appears to have been done on the effect of aberrations introduced by the collecting telescope.
© (1982) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Patrick S. Cheatham, Patrick S. Cheatham, } "Effect Of Optical Aberrations On Scanning Michelson Interferometers", Proc. SPIE 0327, Sensor Design Using Computer Tools, (30 June 1982); doi: 10.1117/12.933356; https://doi.org/10.1117/12.933356
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