30 June 1982 Utilization Of SYSCAP II Circuit Analysis Program For Electro-Optical Circuit Design
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Proceedings Volume 0327, Sensor Design Using Computer Tools; (1982) https://doi.org/10.1117/12.933363
Event: 1982 Los Angeles Technical Symposium, 1982, Los Angeles, United States
Abstract
The successful development of various electro-optical systems is highly dependent on precise electronic circuit design which must account for possible parameter drift in the various piece-parts. The utilization of a comprehensive computer analysis program (SYSCAP II) provides the electro-optical system designer and electro-optical management with a well-structured tool for a comprehensive circuit analysis. An overview of the SYSCAP II program is being presented with examples applicable to electro-optical design problems. In particular, the program has been used for extensive radiation effects predictions of semi-conductor response to various transient and permanent radiation effects. Worst-case, Monte Carlo, and component failure simulation (CFS) are discussed with respect to the electro-optical design challenges for the 1980s, including "design for producibility". The SYSCAP II program is provided through Control Data Corporation (CDC) with Rockwell International providing the technology under a licensing arrangement with Control Data Corporation. As a result, the techniques described in this paper can be readily used by the electro-optical design community.
© (1982) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. T. Kleiner, C. T. Kleiner, } "Utilization Of SYSCAP II Circuit Analysis Program For Electro-Optical Circuit Design", Proc. SPIE 0327, Sensor Design Using Computer Tools, (30 June 1982); doi: 10.1117/12.933363; https://doi.org/10.1117/12.933363
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