Diagnostic Testing For Evaluation Of Semiconductor Lasers For Space Communications

A. J. Einhorn; D. B. Hall; P. R. Nelson

doi:10.1117/12.933883

23 July 1982 Diagnostic Testing For Evaluation Of Semiconductor Lasers For Space Communications

A. J. Einhorn, D. B. Hall, P. R. Nelson

Proceedings Volume 0328, Laser and Laser Systems Reliability; (1982) https://doi.org/10.1117/12.933883
Event: 1982 Los Angeles Technical Symposium, 1982, Los Angeles, United States

Abstract

Consistent performance and long lifetime in the space environment at high data rates are key issues in determining the applicability of semiconductor lasers for space communications. An understanding of the physical and optical characteristics of the laser diodes is required before failure criteria for this application can be stated. Many early life failures can be eliminated by a combination of quality screening and manufacturing process control. Essential device evaluation and failure analysis techniques are being developed to assure availability of long life diode lasers for this application.

Citation Download Citation

A. J. Einhorn, D. B. Hall, and P. R. Nelson "Diagnostic Testing For Evaluation Of Semiconductor Lasers For Space Communications", Proc. SPIE 0328, Laser and Laser Systems Reliability, (23 July 1982); https://doi.org/10.1117/12.933883

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