15 October 1982 Temperature and Chemical Vapor Deposition (CVD) film effects on wafer flatness
Author Affiliations +
Proceedings Volume 0342, Integrated Circuit Metrology I; (1982) https://doi.org/10.1117/12.933684
Event: 1982 Technical Symposium East, 1982, Arlington, United States
The dependency of wafer flatness on high temperature and Chemical Vapor Deposition (CVD) processes has been quantified for a 400 gate array bipolar process. Experimental data is presented which describes wafer flatness variations at six critical front-end process steps.
© (1982) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter Gise, Peter Gise, } "Temperature and Chemical Vapor Deposition (CVD) film effects on wafer flatness", Proc. SPIE 0342, Integrated Circuit Metrology I, (15 October 1982); doi: 10.1117/12.933684; https://doi.org/10.1117/12.933684

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