28 December 1982 Proposed Figures Of Merit For Staring Focal Planes
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Proceedings Volume 0344, Infrared Sensor Technology; (1982) https://doi.org/10.1117/12.933749
Event: 1982 Technical Symposium East, 1982, Arlington, United States
Abstract
This work reflects the methodology used at Rockwell International in the radiometric evaluation of IR/CCD focal plane elements. It is intended as an input which, when combined with inputs from other industrial and government groups, will result in standardized procedures for the evaluation of detector/charge-coupled devices similar to the procedures prepared by DOD for the evaluation of infrared detectors. Specifically, data collection, data reduction, and data formats are discussed, as well as proposed figures of merit for quantum yield and device noise.
© (1982) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. B. Birtley, W. B. Birtley, "Proposed Figures Of Merit For Staring Focal Planes", Proc. SPIE 0344, Infrared Sensor Technology, (28 December 1982); doi: 10.1117/12.933749; https://doi.org/10.1117/12.933749
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