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1 March 1983 Dynamic Tests And Application Of The Electron-Optical Measuring System
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Proceedings Volume 0348, 15th Intl Congress on High Speed Photography and Photonics; (1983) https://doi.org/10.1117/12.967730
Event: 15th International Congress on High Speed Photography and Photonics, 1982, San Diego, United States
Abstract
The basic and dynamic performances of the new Electron-Optical measuring system type EWE in conjunction with various laser applications are presented. The system consists of Electron-Optical streak camera which is sensitive in the spectral recion from 380 nm to 1100 nm, TV read-out device and microprocessor controlled frame memory. Main features of the developed system will be described. The limiting temporal resolution has been measured to be 1.4 ps at FWEM. The dynamic range Of 70 at the measured duration of 5 ps has been obtained.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. Hiruma, H. Ilida, E. Inuzuka, K. Kamiya, Y. Tsuchiya, A. M. Prokhorov, V. N. Platonov, V. E. Postovalov, Yu. N. Serdyuchenko, and M. Ya. Schelev "Dynamic Tests And Application Of The Electron-Optical Measuring System", Proc. SPIE 0348, 15th Intl Congress on High Speed Photography and Photonics, (1 March 1983); https://doi.org/10.1117/12.967730
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