1 March 1983 Proposed System For High Speed Materials Testing Of Microtargets Under Dynamic Load Using Flash X-Ray Diffraction (FXD) Analysis
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Proceedings Volume 0348, 15th Intl Congress on High Speed Photography and Photonics; (1983) https://doi.org/10.1117/12.967823
Event: 15th International Congress on High Speed Photography and Photonics, 1982, San Diego, United States
Abstract
Flash X-Ray Diffraction (FXD) is a method of high potential to study lattice compression and phase transformations in shock-compressed matter. The technique commonly applied records a back reflection diffraction pattern at the back side of the target, while its front side is struck by a projectile. However, since the experimental time window for recording is very narrow, only low-atomic number materials could be investigated successfully. The extension to materials of higher density would be of substantial practical interest, as well as a simulation of longer lasting loading histories in the microsecond regime. Furthermore, since only a small target volume is necessary for FXD diagnostics, a miniature compression method rather than conventional impact methods would be more adequate, in regard both to tube and film protection, and usable x-ray energy. The present paper discusses a pulsed, linear magnetic pinch technique for micro-target compression and possible applications in a Debye-Scherrer FXD setup.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter Krehl, Peter Krehl, } "Proposed System For High Speed Materials Testing Of Microtargets Under Dynamic Load Using Flash X-Ray Diffraction (FXD) Analysis", Proc. SPIE 0348, 15th Intl Congress on High Speed Photography and Photonics, (1 March 1983); doi: 10.1117/12.967823; https://doi.org/10.1117/12.967823
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