Flash X-Ray Diffraction (FXD) is a method of high potential to study lattice compression and phase transformations in shock-compressed matter. The technique commonly applied records a back reflection diffraction pattern at the back side of the target, while its front side is struck by a projectile. However, since the experimental time window for recording is very narrow, only low-atomic number materials could be investigated successfully. The extension to materials of higher density would be of substantial practical interest, as well as a simulation of longer lasting loading histories in the microsecond regime. Furthermore, since only a small target volume is necessary for FXD diagnostics, a miniature compression method rather than conventional impact methods would be more adequate, in regard both to tube and film protection, and usable x-ray energy. The present paper discusses a pulsed, linear magnetic pinch technique for micro-target compression and possible applications in a Debye-Scherrer FXD setup.