7 July 1983 Automated Data Reduction For Speckle Metrology
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Abstract
Speckle Metrology has transitioned from a laboratory curiosity to a useful engineering tool. It is now in a stage where some means is required to process the enormous amount of data it is capable of generating. This paper explores the requirements and characteristics for an automated data reduction system. Examples are given of current operational systems and what direction future system developments may take.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gene E. Maddux, Gene E. Maddux, "Automated Data Reduction For Speckle Metrology", Proc. SPIE 0353, Industrial and Commercial Applications of Holography, (7 July 1983); doi: 10.1117/12.933944; https://doi.org/10.1117/12.933944
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