PROCEEDINGS VOLUME 0362
26TH ANNUAL TECHNICAL SYMPOSIUM | 24-27 AUGUST 1982
Scattering in Optical Materials II
Editor(s): Solomon Musikant
IN THIS VOLUME

1 Sessions, 28 Papers, 0 Presentations
All Papers  (28)
26TH ANNUAL TECHNICAL SYMPOSIUM
24-27 August 1982
San Diego, United States
All Papers
Proc. SPIE 0362, Light Scattering In Ceramics, 0000 (5 April 1983); doi: 10.1117/12.934125
Proc. SPIE 0362, Scattering In Znse Laser Windows, 0000 (5 April 1983); doi: 10.1117/12.934126
Proc. SPIE 0362, Applications Of Raman Scattering Spectroscopy To Halide Glasses, 0000 (5 April 1983); doi: 10.1117/12.934127
Proc. SPIE 0362, Infrared Laser Stimulated Desorption Of Pyridine From Silver Surfaces, 0000 (5 April 1983); doi: 10.1117/12.934128
Proc. SPIE 0362, Raman Scattering From Surface Molecules Excited By Guided Optical Waves And Surface Plasmons, 0000 (5 April 1983); doi: 10.1117/12.934129
Proc. SPIE 0362, Comparison Of Theory And Experiments For Bidirectional Reflectance Distribution Function (BRDF) Of Microrough Surfaces, 0000 (5 April 1983); doi: 10.1117/12.934130
Proc. SPIE 0362, Comparison Of Measurements By Different Instruments Of The Far-Infrared Reflectance Of Rough, Optically Black Coatings, 0000 (5 April 1983); doi: 10.1117/12.934131
Proc. SPIE 0362, New Black Paint For Cryogenic Infrared Applications, 0000 (5 April 1983); doi: 10.1117/12.934132
Proc. SPIE 0362, Far-Infrared Reflectance Spectra Of Optical Black Coatings, 0000 (5 April 1983); doi: 10.1117/12.934133
Proc. SPIE 0362, Electrically Conductive Black Optical Paint, 0000 (5 April 1983); doi: 10.1117/12.934134
Proc. SPIE 0362, Scatter Evaluation Of Supersmooth Surfaces, 0000 (5 April 1983); doi: 10.1117/12.934135
Proc. SPIE 0362, Optical Surface Analysis Code (OSAC), 0000 (5 April 1983); doi: 10.1117/12.934136
Proc. SPIE 0362, Objective Measurement And Characterization Of Scratch Standards, 0000 (5 April 1983); doi: 10.1117/12.934137
Proc. SPIE 0362, Specular Spectral Reflectance Of A1S1304 Stainless Steel At Near-Normal Incidence, 0000 (5 April 1983); doi: 10.1117/12.934138
Proc. SPIE 0362, Effects Of Standard Optical Shop Practices On Scattering, 0000 (5 April 1983); doi: 10.1117/12.934139
Proc. SPIE 0362, Light Scattering From An Interface Bubble, 0000 (5 April 1983); doi: 10.1117/12.934140
Proc. SPIE 0362, Degradation Of Optical Materials Exposed To Erosive Environments, 0000 (5 April 1983); doi: 10.1117/12.934141
Proc. SPIE 0362, Damage Of Infrared-Transparent Materials Exposed To Rain Environments At High Velocities, 0000 (5 April 1983); doi: 10.1117/12.934142
Proc. SPIE 0362, Damage Susceptibility Of Ring Laser Gyro Class Optics, 0000 (5 April 1983); doi: 10.1117/12.934143
Proc. SPIE 0362, Light Scattering In Leached Antireflection Surfaces, 0000 (5 April 1983); doi: 10.1117/12.934144
Proc. SPIE 0362, Low Scatter And Surface Figure Histories Of The Space Infrared Experiment (SIRE) Primary Mirrors, 0000 (5 April 1983); doi: 10.1117/12.934145
Proc. SPIE 0362, Multiplexer For Scattering Measurements, 0000 (5 April 1983); doi: 10.1117/12.934146
Proc. SPIE 0362, Instrumentation Of A Variable Angle Scatterometer (VAS), 0000 (5 April 1983); doi: 10.1117/12.934147
Proc. SPIE 0362, Design Review Of Three Reflectance Scatterometers, 0000 (5 April 1983); doi: 10.1117/12.934148
Proc. SPIE 0362, Description And Limitations Of An Automated Scatterometer, 0000 (5 April 1983); doi: 10.1117/12.934149
Proc. SPIE 0362, Role Of Diagnostic Testing In Identifying And Resolving Dimensional Stability Problems In Electroplated Laser Mirrors, 0000 (5 April 1983); doi: 10.1117/12.934150
Proc. SPIE 0362, High Temperature Millimeter Wave Dielectric Characterization Of Radome Materials, 0000 (5 April 1983); doi: 10.1117/12.934151
Proc. SPIE 0362, Effects Of Substrate Scattering On Bar-Code Scanning Signals, 0000 (5 April 1983); doi: 10.1117/12.934152
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