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5 April 1983 High Temperature Millimeter Wave Dielectric Characterization Of Radome Materials
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Abstract
Experimental methods have been developed to determine the millimeter wave dielectric properties of materials at temperatures up to 1600°C. Accuracies of the order of ±1.5% for dielectric constant measurements and ±5% with a detection limit of ±0.0001 for loss tangent measurement over the entire temperature range have been demonstrated.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. W. Ho "High Temperature Millimeter Wave Dielectric Characterization Of Radome Materials", Proc. SPIE 0362, Scattering in Optical Materials II, (5 April 1983); https://doi.org/10.1117/12.934151
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