23 August 1983 Diffraction Limited Focusing Grating For High Energy Laser Diagnostics
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Abstract
A focusing sampling grating can be synthesized by combining a linear grating with a computer plotted zone plate. Phase front distortion figures below λ/20 can be achieved for sampler geometries calling for any diffraction angle and f-numbers down to one. The technique can be generalized for curved substrates.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Francois M. Mottier, Francois M. Mottier, } "Diffraction Limited Focusing Grating For High Energy Laser Diagnostics", Proc. SPIE 0365, Adaptive Optics Systems and Technology, (23 August 1983); doi: 10.1117/12.934209; https://doi.org/10.1117/12.934209
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