29 March 1983 Applications Of High Voltage Electron Microscopy In Materials Science
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Proceedings Volume 0368, Microscopy: Techniques and Capabilities; (1983) https://doi.org/10.1117/12.934323
Event: Microscopy-Techniques and Capabilities, 1982, London, United Kingdom
The principal advantages of the high voltage electron microscope, higher resolution, penetrating power, decreased radiation damage and the special effects of critical voltage and displacement damage are outlined. Some application of increased penetration and radiation damage to studies in materials science are then discussed in more detail.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. J. Goringe, M. J. Goringe, "Applications Of High Voltage Electron Microscopy In Materials Science", Proc. SPIE 0368, Microscopy: Techniques and Capabilities, (29 March 1983); doi: 10.1117/12.934323; https://doi.org/10.1117/12.934323

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