16 June 1983 Advances In Optical Metrology Of Complex Objects
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Proceedings Volume 0369, Max Born Centenary Conf; (1983) https://doi.org/10.1117/12.934369
Event: The Max Born Centenary Conference, 1982, Edinburgh, United Kingdom
Abstract
It has been shown previously that Electronic Speckle Pattern Interferometry can be used to compare the shape of nominally identical components. Techniques for calibrating the measurements and for converting the fringe data to surface shape information are discussed here and the accuracy of the measurements has been established.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. Wykes, C. Wykes, R. Jones, R. Jones, } "Advances In Optical Metrology Of Complex Objects", Proc. SPIE 0369, Max Born Centenary Conf, (16 June 1983); doi: 10.1117/12.934369; https://doi.org/10.1117/12.934369
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