7 November 1983 Plasma Line Emission Profile Measurements On ZT-40M
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Proceedings Volume 0380, Los Alamos Conf on Optics '83; (1983) https://doi.org/10.1117/12.934783
Event: Los Alamos Conference on Optics, 1983, New Mexico, United States
Abstract
Two different approaches to spectral line emission profile measurement in the ZT-40M Reversed Field Pinch will be discussed. In the first case, VUV emissions (>> 50 nm) are dispersed by a 1-meter normal incidence spectrometer, then wavelength converted by sodium salycilate. The resultant visible image is magnified and dissected using a series of slits machined in a rotating drum which contains the detector. Resolutions of 0.06 nm and 0.1 ms are achieved. In the second method, visible and near UV light is dispersed in a 1-meter spectrometer which has an ITT Vidissector mounted at the exit plane. In this detector, photoelectrons generated at the photocathode are magnetically swept across a narrow slit, permitting scans over > 10 nm of the spectrum in < 0.1 ms. Spectral resolution of < 0.1 nm is also possible.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. B. Howell, P. G. Weber, "Plasma Line Emission Profile Measurements On ZT-40M", Proc. SPIE 0380, Los Alamos Conf on Optics '83, (7 November 1983); doi: 10.1117/12.934783; https://doi.org/10.1117/12.934783
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