Translator Disclaimer
7 November 1983 Plasma Line Emission Profile Measurements On ZT-40M
Author Affiliations +
Proceedings Volume 0380, Los Alamos Conf on Optics '83; (1983)
Event: Los Alamos Conference on Optics, 1983, New Mexico, United States
Two different approaches to spectral line emission profile measurement in the ZT-40M Reversed Field Pinch will be discussed. In the first case, VUV emissions (>> 50 nm) are dispersed by a 1-meter normal incidence spectrometer, then wavelength converted by sodium salycilate. The resultant visible image is magnified and dissected using a series of slits machined in a rotating drum which contains the detector. Resolutions of 0.06 nm and 0.1 ms are achieved. In the second method, visible and near UV light is dispersed in a 1-meter spectrometer which has an ITT Vidissector mounted at the exit plane. In this detector, photoelectrons generated at the photocathode are magnetically swept across a narrow slit, permitting scans over > 10 nm of the spectrum in < 0.1 ms. Spectral resolution of < 0.1 nm is also possible.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. B. Howell and P. G. Weber "Plasma Line Emission Profile Measurements On ZT-40M", Proc. SPIE 0380, Los Alamos Conf on Optics '83, (7 November 1983);

Back to Top