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4 October 1983 Analysis Of 12-700 µm Reflectance Spectra Of Three Optical Black Samples
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Proceedings Volume 0384, Generation, Measurement and Control of Stray Radiation III; (1983) https://doi.org/10.1117/12.934936
Event: 1983 Los Angeles Technical Symposium, 1983, Los Angeles, United States
Abstract
Normal incidence, specular reflectance spectra of three samples of optical black coatings have been measured in 10 filter passbands at effective wavelengths between 12 and 700 μm. Strong absorption, due to amorphous silicate material in the coatings, is found in the 15-50 μm region of each spectrum. Reflecting-layer model calculations are fitted by a non-linear least-squares routine to the spectra at wavelengths beyond the absorption band to determine far-infrared optical parameters. It is found that, with a similar wavelength dependence, the absorption coefficient of a new black coating (ECP 2200) made by the Minnesota Mining and Manufacturing Company (3M) is less than 1/10 that of the discontinued coating, 3M Black Velvet Nextel. It is also shown that the extinction effect of a very rough substrate is negligible compared with the effects of increased upper surface roughness and coating thickness attendant upon fully covering a very rough substrate.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sheldon M. Smith "Analysis Of 12-700 µm Reflectance Spectra Of Three Optical Black Samples", Proc. SPIE 0384, Generation, Measurement and Control of Stray Radiation III, (4 October 1983); https://doi.org/10.1117/12.934936
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