4 October 1983 Total Reflectance Properties Of Certain Black Coatings (From 0.2 To 20.0 Micrometers)
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Proceedings Volume 0384, Generation, Measurement and Control of Stray Radiation III; (1983) https://doi.org/10.1117/12.934933
Event: 1983 Los Angeles Technical Symposium, 1983, Los Angeles, United States
Abstract
The total reflectance of certain black coatings which might be used as optical blacks has been measured at near normal incidence in integrating sphere spectrophotometers from 0.2 to 20.0 micrometers. Scanning Electron Microscope (SEM) pictures of some of the surfaces have been made. Some of the surfaces exhibit relatively constant spectral reflectance, but others show extensive spectral selectivity. Surface topography shows wide variations in structure and appears to correlate with reflectance properties. Renewed interest in the emissivity and absorptance of surfaces for thermal radiative transfer in cryogenics, space, solar applications, etc., has brought to bear technologies for measurement which were not practical in the early days of the space program. Two such technologies are SEM and integrating sphere spectrophotometers in the 2.5 to 20.0 micrometer range.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ronald R. Willey, Ronald W. George, James G. Ohmart, John W. Walvoord, "Total Reflectance Properties Of Certain Black Coatings (From 0.2 To 20.0 Micrometers)", Proc. SPIE 0384, Generation, Measurement and Control of Stray Radiation III, (4 October 1983); doi: 10.1117/12.934933; https://doi.org/10.1117/12.934933
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