Optimal Properties Of Photorefractive Materials For Optical Data Processing

George C. Valley; Marvin B. Klein

doi:10.1117/12.934995

23 December 1983 Optimal Properties Of Photorefractive Materials For Optical Data Processing

George C. Valley, Marvin B. Klein

Proceedings Volume 0388, Advances in Optical Information Processing I; (1983) https://doi.org/10.1117/12.934995
Event: 1983 Los Angeles Technical Symposium, 1983, Los Angeles, United States

Abstract

The charge transport model of photorefractivity is used to evaluate four figures of merit that can be used to characterize the performance of photorefractive materials. The figures of merit are the steady-state index change, the response time, the energy per area to write a grating with one percent diffraction efficiency, and the index change per absorbed energy per unit volume (photorefractive sensitivity). These indices are evaluated as a function of grating period and applied external electric field for Bi₁₂Si0₂₀, a fast material with a relatively small electro-optic coefficient and BaTiO₃, a slower material with a much larger electro-optic coefficient. Methods for optimizing the materials are discussed.

Citation Download Citation

George C. Valley and Marvin B. Klein "Optimal Properties Of Photorefractive Materials For Optical Data Processing", Proc. SPIE 0388, Advances in Optical Information Processing I, (23 December 1983); https://doi.org/10.1117/12.934995

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