A High Speed, High Resolution, Laser Scanner Subsystem; Measurement Techniques

Lee M. Burberry

doi:10.1117/12.935025

20 September 1982 A High Speed, High Resolution, Laser Scanner Subsystem; Measurement Techniques

Lee M. Burberry

Proceedings Volume 0390, High Speed Read/Write Techniques for Advanced Printing and Data Handling; (1982) https://doi.org/10.1117/12.935025
Event: 1983 Los Angeles Technical Symposium, 1983, Los Angeles, United States

Abstract

Techniques for testing laser scanning subsystems play an important role in their development. Testing determines how well the design was implemented, indicates whether all pertinent factors were taken into consideration during the design and error analysis, and most importantly, demonstrates system performance. This paper will discuss typical test methods for scanner subsystems designed and fabricated by the Optical Systems Department of Harris Government Communications Systems Division. Specifications for one Harris scanner are given in Table 1, and a method to test each parameter is discussed below.

Citation Download Citation

Lee M. Burberry "A High Speed, High Resolution, Laser Scanner Subsystem; Measurement Techniques", Proc. SPIE 0390, High Speed Read/Write Techniques for Advanced Printing and Data Handling, (20 September 1982); https://doi.org/10.1117/12.935025

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