30 November 1983 High Frequency Wavelength Modulation Spectroscopy With Diode Lasers For Optical Memory Applications
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Proceedings Volume 0395, Advanced Infrared Sensor Technology; (1983) https://doi.org/10.1117/12.935178
Event: 1983 International Technical Conference/Europe, 1983, Geneva, Switzerland
Abstract
High frequency wavelength modulation spectroscopy with diode lasers is accomplished by dithering the drive current at RF frequencies between 10 and 250 MHz. This technique is useful for fast and sensitive detection of absorption lines and is applied for fast reading of information from a frequency domain optical memory based upon photochemical hole burning.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Pokrowsky, P. Pokrowsky, W. Zapka, W. Zapka, F. Chu, F. Chu, G. C. Bjorklund, G. C. Bjorklund, } "High Frequency Wavelength Modulation Spectroscopy With Diode Lasers For Optical Memory Applications", Proc. SPIE 0395, Advanced Infrared Sensor Technology, (30 November 1983); doi: 10.1117/12.935178; https://doi.org/10.1117/12.935178
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