26 October 1983 New Mean For The Assessment Of Flatness By Holography
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Proceedings Volume 0398, Industrial Applications of Laser Technology; (1983) https://doi.org/10.1117/12.935370
Event: 1983 International Technical Conference/Europe, 1983, Geneva, Switzerland
Abstract
The objective of this work is to find a new mean for macro and micro assessment of flat surface. The holography technique is used to get three dimensional measurement of flat surface under consideration. The holographic contour generation using two reference waves is applied. From the hologram mathematical model for the suggested assessment is established. Seven flat specimens with different machining conditions were prepared for the application of the proposed technique. The assessment parameters that are established to distinguish between the various surfaces are:- 1. The coefficient of correlation of the surface points fitted to a flat surface. 2. The mean deviation of the perpendicular distance between surface points and least square plane. 3. The true bearing area diagram (not the bearing length diagram). 4. The ratio between the volume surface topography above the reference plane and the area of the surface.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. F. Rashed, S. M. El-Fayoumi, M. A. Younis, "New Mean For The Assessment Of Flatness By Holography", Proc. SPIE 0398, Industrial Applications of Laser Technology, (26 October 1983); doi: 10.1117/12.935370; https://doi.org/10.1117/12.935370
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