26 October 1983 The Calculation Of Wave Aberration Coefficients And Wave Aberration Derivatives From Ray Trace Data
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Proceedings Volume 0399, Optical System Design, Analysis, and Production; (1983) https://doi.org/10.1117/12.935425
Event: 1983 International Technical Conference/Europe, 1983, Geneva, Switzerland
Abstract
During the preparation of the paper describing the design and manufacturing of micro-electronic lenses it was observed that the wave aberration coefficients in the sagittal fan did not converge exactly to their axial values, when the field was asymptotically approaching the axis. Further work, which involved the calculation of partial derivatives of wave aberration with respect to curvatures and thicknesses along selected rays, also gave systematic errors when compared to the asymptotic values obtained from finite diff-erence calculations. The formulae used for calculating the wave aberrations were those introduced by H.H. Hopkins and their approximations are described in the above references. However, the design of an x-ray telescope for 5O Å wavelength had forced the authors to reexamine the basic ideas.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. S. Wilczynski, J. S. Wilczynski, R. E. Tibbetts, R. E. Tibbetts, } "The Calculation Of Wave Aberration Coefficients And Wave Aberration Derivatives From Ray Trace Data", Proc. SPIE 0399, Optical System Design, Analysis, and Production, (26 October 1983); doi: 10.1117/12.935425; https://doi.org/10.1117/12.935425
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