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9 December 1983 Can You Describe Optical Surface Quality With One Or Two Numbers?
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Proceedings Volume 0406, Optical Specifications: Components and Systems; (1983)
Event: 1983 Technical Symposium East, 1983, Arlington, United States
This talk discusses two optical surface quality standards, total integrated scatter (T1S) and the scratch and dig standard (MIL-0-13830A). I begin by using Fourier optics to show that the well known expression, It/I(0) = 4 k2a2, which relates scattered power to rms roughness a, is truly valid only for certain classes of surfaces. Vector scattering theory applied to a more general case shows that in fact optics can measure only a bandwidth limited roughness that can be related to scattered power only if the surface statistics are known. For this reason, the standard should perhaps be regarded as a scattered light standard and not as a surface roughness standard. I conclude by describing our use of a novel optical system to develop an objective measurement technique to aid in the manufacture of the artifacts used to implement the scratch standard.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Matt Young "Can You Describe Optical Surface Quality With One Or Two Numbers?", Proc. SPIE 0406, Optical Specifications: Components and Systems, (9 December 1983);

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